"huygens" displays various single and double-slit interference patterns, both as amplitude patterns (as one might see in a wave tank) and as intensity patterns (as one might see on a distant screen).

"huygens" was programmed by Jim Sethna, using tools developed by the SSS project. Huygen's principle is the approximation that a wave pattern passing through an aperture can be reconstructed by superimposing point sources across the face of the aperture. The program huygens uses this principle to model diffraction through vertical apertures --- slits of variable number and width. Thin slits are represented as a sum of point sources along a vertical line; thick slits are represented as a sum of several thin slits.

About the SSS Project.

Statistical Mechanics: Entropy, Order Parameters, and Complexity, now available at Oxford University Press (USA, Europe).

Statistical Mechanics: Entropy, Order Parameters, and Complexity, now available at Oxford University Press (USA, Europe).